diff --git a/base_classes/NXbeam.nxdl.xml b/base_classes/NXbeam.nxdl.xml index c7d132cc9e..8dd5a5b603 100644 --- a/base_classes/NXbeam.nxdl.xml +++ b/base_classes/NXbeam.nxdl.xml @@ -400,6 +400,57 @@ + + + Type of electron amplifier, MCP, channeltron, etc. + + + + + Description of the detector type, DLD, Phosphor+CCD, CMOS. + + + + + Voltage applied to detector. + + + + + Voltage applied to the amplifier. + + + + + The low voltage of the amplifier migh not be the ground. + + + + + Size of each imaging sensor chip on the detector. + + + + + Number of imaging sensor chips on the detector. + + + + + Physical size of the pixels of the imaging chip on the detector. + + + + + Number of raw active elements in each dimension. Important for swept scans. + + + + + raw data output from the detector + + + The NeXus coordinate system defines the Z axis to be along the nominal beam diff --git a/base_classes/NXentry.nxdl.xml b/base_classes/NXentry.nxdl.xml index 2bb4ca533e..1247e68b76 100755 --- a/base_classes/NXentry.nxdl.xml +++ b/base_classes/NXentry.nxdl.xml @@ -219,6 +219,38 @@ + + + City and country where the experiment took place + + + + + Start time of experimental run that includes the current + measurement, for example a beam time. + + + + + End time of experimental run that includes the current + measurement, for example a beam time. + + + + + Name of the institution hosting the facility + + + + + Name of the experimental facility + + + + + Name of the laboratory or beamline + + diff --git a/base_classes/NXsample.nxdl.xml b/base_classes/NXsample.nxdl.xml index 43bb316334..5eb528cab6 100755 --- a/base_classes/NXsample.nxdl.xml +++ b/base_classes/NXsample.nxdl.xml @@ -288,9 +288,7 @@ - - In case it is all we know and we want to record/document it - + In case it is all we know and we want to record/document it @@ -328,6 +326,116 @@ sample thickness + + + Identification number or signatures of the sample used. + + + + + A descriptor to keep track of the treatment of the sample before entering the + photoemission experiment. Ideally, a full report of the previous operations, in + any format (NXnote allows to add pictures, audio, movies). Alternatively, a + reference to the location or a unique identifier or other metadata file. In the + case these are not available, free-text description + + + + + Physical state of the sample + + + + + Chemical purity of the sample + + + + + Surface termination of the sample (if crystalline) + + + + + Number of layers of the sample (e.g. bulk, monolayer, pentalayer, etc.) + + + + + Full chemical name of the sample + + + + + CAS registry number of the sample chemical content. + + + + + Gases might be fluxed on the surface for various reasons. Chemical designation, + or residual. + + + + + In the case of a fixed pressure measurement this is the scalar pressure. In the + case of an experiment in which pressure changes, or anyway is recorded, this is + an array of length m of pressures. + + + + + Element of evaporated surface dopant such as alkali or other + + + + + Nominal thickness of the evaporated dopant + + + + + Voltage applied to sample and sample holder. + + + + + Sample growth method (e. g. molecular beam epitaxy, chemical vapor deposition + etc.) + + + + + Name of the sample vendor (company or research group) + + + + + Material of the substrate in direct contact with the sample. + + + + + Physical state of the substrate, similar options to sample_state + + + + + Current to neutralize the photoemission current. This field may also be found in + NXmanpulator if present. + + + + + Possible bias of the sample with respect to analyser ground. This field may also + be found as sample_bias in NXmanipulator if present. + + + + + Further notes. + + As a function of Wavelength diff --git a/base_classes/NXsource.nxdl.xml b/base_classes/NXsource.nxdl.xml index 85900d3f03..53946c7660 100644 --- a/base_classes/NXsource.nxdl.xml +++ b/base_classes/NXsource.nxdl.xml @@ -163,7 +163,41 @@ For storage rings, the current at the end of the most recent injection. date and time of the most recent injection. - + + + The center photon energy of the source, before it is + monochromatized or converted + + + + + The center wavelength of the source, before it is + monochromatized or converted + + + + + For pulsed sources, the energy of a single pulse + + + + + For pulsed sources, the pulse energy divided + by the pulse duration + + + + + Some facilities tag each bunch. + First bunch of the measurement + + + + + Last bunch of the measurement + + + "Engineering" location of source.