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Readds mpes relevant changes from 4b064d9
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@domna
domna committed Aug 15, 2023
1 parent 47d30d3 commit 38ed45e
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51 changes: 51 additions & 0 deletions base_classes/NXbeam.nxdl.xml
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</doc>
</attribute>

<field name="amplifier_type" type="NX_CHAR">
<doc>
Type of electron amplifier, MCP, channeltron, etc.
</doc>
</field>
<field name="detector_type" type="NX_CHAR">
<doc>
Description of the detector type, DLD, Phosphor+CCD, CMOS.
</doc>
</field>
<field name="detector_voltage" type="NX_FLOAT" units="NX_VOLTAGE">
<doc>
Voltage applied to detector.
</doc>
</field>
<field name="amplifier_voltage" type="NX_FLOAT" units="NX_VOLTAGE">
<doc>
Voltage applied to the amplifier.
</doc>
</field>
<field name="amplifier_bias" type="NX_FLOAT" units="NX_VOLTAGE">
<doc>
The low voltage of the amplifier migh not be the ground.
</doc>
</field>
<field name="sensor_size" type="NX_FLOAT" units="NX_LENGTH">
<doc>
Size of each imaging sensor chip on the detector.
</doc>
</field>
<field name="sensor_count" type="NX_INT" units="NX_UNITLESS">
<doc>
Number of imaging sensor chips on the detector.
</doc>
</field>
<field name="sensor_pixel_size" type="NX_FLOAT" units="NX_LENGTH">
<doc>
Physical size of the pixels of the imaging chip on the detector.
</doc>
</field>
<field name="sensor_pixels" type="NX_INT" units="NX_UNITLESS">
<doc>
Number of raw active elements in each dimension. Important for swept scans.
</doc>
</field>
<group type="NXdata">
<doc>
raw data output from the detector
</doc>
</group>

<field name="depends_on" minOccurs="0" type="NX_CHAR">
<doc>
The NeXus coordinate system defines the Z axis to be along the nominal beam
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32 changes: 32 additions & 0 deletions base_classes/NXentry.nxdl.xml
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Expand Up @@ -219,6 +219,38 @@
</enumeration>
</attribute>
</group>
<field name="experiment_location">
<doc>
City and country where the experiment took place
</doc>
</field>
<field name="experiment_start_date" type="NX_DATE_TIME">
<doc>
Start time of experimental run that includes the current
measurement, for example a beam time.
</doc>
</field>
<field name="experiment_end_date" type="NX_DATE_TIME">
<doc>
End time of experimental run that includes the current
measurement, for example a beam time.
</doc>
</field>
<field name="experiment_institution">
<doc>
Name of the institution hosting the facility
</doc>
</field>
<field name="experiment_facility">
<doc>
Name of the experimental facility
</doc>
</field>
<field name="experiment_laboratory">
<doc>
Name of the laboratory or beamline
</doc>
</field>
<group type="NXuser" />
<group type="NXsample" />
<group type="NXinstrument" />
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114 changes: 111 additions & 3 deletions base_classes/NXsample.nxdl.xml
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Expand Up @@ -288,9 +288,7 @@
</dimensions>
</field>
<field name="unit_cell_class">
<doc>
In case it is all we know and we want to record/document it
</doc>
<doc>In case it is all we know and we want to record/document it</doc>
<enumeration>
<item value="triclinic" />
<item value="monoclinic" />
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<field name="thickness" type="NX_FLOAT" units="NX_LENGTH">
<doc>sample thickness</doc>
</field>
<field name="sample_id" type="NX_CHAR">
<doc>
Identification number or signatures of the sample used.
</doc>
</field>
<group name="sample_history" type="NXnote">
<doc>
A descriptor to keep track of the treatment of the sample before entering the
photoemission experiment. Ideally, a full report of the previous operations, in
any format (NXnote allows to add pictures, audio, movies). Alternatively, a
reference to the location or a unique identifier or other metadata file. In the
case these are not available, free-text description
</doc>
</group>
<field name="state" type="NX_CHAR">
<doc>
Physical state of the sample
</doc>
</field>
<field name="purity" type="NX_FLOAT" units="NX_UNITLESS">
<doc>
Chemical purity of the sample
</doc>
</field>
<field name="orientation" type="NX_CHAR">
<doc>
Surface termination of the sample (if crystalline)
</doc>
</field>
<field name="layer" type="NX_CHAR">
<doc>
Number of layers of the sample (e.g. bulk, monolayer, pentalayer, etc.)
</doc>
</field>
<field name="chemical_name" type="NX_CHAR">
<doc>
Full chemical name of the sample
</doc>
</field>
<field name="chem_id_cas" type="NX_CHAR">
<doc>
CAS registry number of the sample chemical content.
</doc>
</field>
<field name="gas" type="NX_CHAR">
<doc>
Gases might be fluxed on the surface for various reasons. Chemical designation,
or residual.
</doc>
</field>
<field name="gas_pressure" type="NX_NUMBER" units="NX_PRESSURE">
<doc>
In the case of a fixed pressure measurement this is the scalar pressure. In the
case of an experiment in which pressure changes, or anyway is recorded, this is
an array of length m of pressures.
</doc>
</field>
<field name="surface_dopant" type="NX_CHAR">
<doc>
Element of evaporated surface dopant such as alkali or other
</doc>
</field>
<field name="surface_dopant_coverage" type="NX_FLOAT" units="NX_LENGTH">
<doc>
Nominal thickness of the evaporated dopant
</doc>
</field>
<field name="bias" type="NX_FLOAT" units="NX_VOLTAGE">
<doc>
Voltage applied to sample and sample holder.
</doc>
</field>
<field name="growth_method" type="NX_CHAR">
<doc>
Sample growth method (e. g. molecular beam epitaxy, chemical vapor deposition
etc.)
</doc>
</field>
<field name="vendor" type="NX_CHAR">
<doc>
Name of the sample vendor (company or research group)
</doc>
</field>
<field name="substrate_material" type="NX_CHAR">
<doc>
Material of the substrate in direct contact with the sample.
</doc>
</field>
<field name="substrate_state" type="NX_CHAR">
<doc>
Physical state of the substrate, similar options to sample_state
</doc>
</field>
<field name="drain_current" type="NX_FLOAT" units="NX_CURRENT">
<doc>
Current to neutralize the photoemission current. This field may also be found in
NXmanpulator if present.
</doc>
</field>
<field name="bias_voltage" type="NX_FLOAT" units="NX_VOLTAGE">
<doc>
Possible bias of the sample with respect to analyser ground. This field may also
be found as sample_bias in NXmanipulator if present.
</doc>
</field>
<group name="notes" type="NXnote">
<doc>
Further notes.
</doc>
</group>
<group name="transmission" type="NXdata">
<doc>As a function of Wavelength</doc>
</group>
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36 changes: 35 additions & 1 deletion base_classes/NXsource.nxdl.xml
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Expand Up @@ -163,7 +163,41 @@
<doc>For storage rings, the current at the end of the most recent injection.</doc>
<attribute name="time" type="NX_DATE_TIME"><doc>date and time of the most recent injection.</doc></attribute>
</field>
<group name="geometry" type="NXgeometry" deprecated="Use the field `depends_on` and :ref:`NXtransformations` to position the source and NXoff_geometry to describe its shape instead">
<field name="photon_energy" type="NX_FLOAT" units="NX_ENERGY">
<doc>
The center photon energy of the source, before it is
monochromatized or converted
</doc>
</field>
<field name="center_wavelength" type="NX_FLOAT" units="NX_WAVELENGTH">
<doc>
The center wavelength of the source, before it is
monochromatized or converted
</doc>
</field>
<field name="pulse_energy" type="NX_FLOAT" units="NX_ENERGY">
<doc>
For pulsed sources, the energy of a single pulse
</doc>
</field>
<field name="peak_power" type="NX_FLOAT" units="NX_POWER">
<doc>
For pulsed sources, the pulse energy divided
by the pulse duration
</doc>
</field>
<field name="bunch_number_start" type="NX_INT">
<doc>
Some facilities tag each bunch.
First bunch of the measurement
</doc>
</field>
<field name="bunch_number_end" type="NX_INT">
<doc>
Last bunch of the measurement
</doc>
</field>
<group name="geometry" type="NXgeometry" deprecated="Use the field `depends_on` and :ref:`NXtransformations` to position the source and NXoff_geometry to describe its shape instead">
<doc>
"Engineering" location of source.
</doc>
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